首页> 外文会议>ISTFA 2008 : Conference proceedings from the 34th international symposium for testing and failure analysis >Stitch-Bond-Shearing in Optoelectronic Devices, Caused by Lead-Free-Wave-Soldering- Do We Need Improved Wire-Bonding Methods?
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Stitch-Bond-Shearing in Optoelectronic Devices, Caused by Lead-Free-Wave-Soldering- Do We Need Improved Wire-Bonding Methods?

机译:由无铅波峰焊引起的光电子器件中的缝合键剪切-我们是否需要改进的引线键合方法?

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This case study shows a typical example of a manufactur-ing-chain-rninduced reliability problem. All participants of the chainrndo their work within specifications, but, looking at the systemrnlevel, severe reliability problems have been observed. In orderrnto get back into the system-level process window, severalrncorrective actions are possible. In this case, the mostrnpromising approach is an improvement of the stitch bondrnrobustness, combined with a clear user specification.
机译:此案例研究显示了制造链引发的可靠性问题的典型示例。链条的所有参与者都在规范内进行工作,但是,从系统级别来看,已经观察到严重的可靠性问题。为了返回系统级过程窗口,可以采取几种纠正措施。在这种情况下,最有前途的方法是改进针脚牢固性,并结合明确的用户规范。

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