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Application Research on the Point Diffraction Interferometer (PDI) for Testing Large Optical System

机译:点衍射干涉仪(PDI)在大型光学系统测试中的应用研究

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@@A new approach for testing the wavefront of the large optical imaging system is proposed. Meanwhile, the technical indexes and adjustment characteristics of the equipment components are analyzed. Extended abstract The large-aperture optical imaging system is widely used in the astronomy observation, due to its long work distance and superior resolution characteristic. The troubles brought by its intrinsic character: large aperture and long focal distance also appears in machining, alignment and testing process. Laser is used in the optical testing because of its outstanding temporal and spatial coherence. Interferometric method is applied in the optical wavefront evaluation. This method has good accuracy at estimating the character of the optical imaging system. At present, the commercial optical interferometer is mostly based on the Fizeau interferometer principle. In the Fizeau interferometer, the reference wavefront will emerge from the criterion lens, and the testing light which contains the information of the tested wavefront will interfere with the reference light, finally, the tested wavefront could be characterized. In the classic wavefront testing method, the autocollimation approach is applied. In that case, a plane mirror with the same caliber of the optical imaging system is necessary. Hence, in the test of optical imaging system with large aperture, manufacturing plane mirror with large size is becoming very difficult. Due to its processing difficulty and high cost, manufacturing plane mirror with large diameter (diameter is larger than 1. 5 meters) is being a technical difficulty in the large diameter optical manufacturing.
机译:提出了一种测试大型光学成像系统波前的新方法。同时,分析了设备部件的技术指标和调整特性。扩展摘要大口径光学成像系统因其工作距离长和分辨率高的特性而被广泛用于天文观测。其固有特性带来的麻烦:大光圈和长焦距也出现在机加工,对准和测试过程中。激光由于其出色的时间和空间相干性而用于光学测试。干涉法应用于光波前评估。该方法在估计光学成像系统的特性方面具有良好的准确性。当前,商用光学干涉仪主要基于菲索干涉仪原理。在Fizeau干涉仪中,参考波前将从标准透镜中出现,并且包含被测波前信息的测试光将与参考光发生干涉,最后可以表征被测波前。在经典的波前测试方法中,采用了自动准直方法。在这种情况下,需要具有与光学成像系统相同口径的平面镜。因此,在具有大光圈的光学成像系统的测试中,制造具有大尺寸的平面镜变得非常困难。由于其加工困难和高成本,制造大直径(直径大于1. 5米)的平面镜是大直径光学制造中的技术难题。

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