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Temperature aware VLSI design for reduced power and reliability enhancement.

机译:具有温度感知功能的VLSI设计可降低功耗并提高可靠性。

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Process scaling and shrinking device geometries have resulted in chips with greater performance and complexity levels. However, these advancements have come at the cost of higher power densities and increased operating temperatures. The inability to control the operating temperatures by existing cooling techniques is the principal reason for discontinuation of an increase in frequencies and introduction of multi-core architectures. Apart from operability, high temperatures have unfavorable consequences such as: increased leakage power, reduced interconnect life time, slowing of interconnects and transistors, need for expensive package and cooling mechanisms, and increased manufacturing cost and design effort. Traditionally, thermal issues have been examined only at the post-synthesis stages of the design flow. This thesis attempts to migrate the "thermal awareness" from the physical level design phase to early stages of the VLSI design flow and utilize it to target various design metrics such as power, performance, reliability, and operability. This thesis advances the procedure of leakage power estimation by coupling it with thermal profile estimation and capturing the positive interdependence between temperature and leakage power. It also advances the traditional role of communication architecture to that of an active thermal manager. The proposed communication architecture based thermal manager delays the execution of chosen components by regulating the flow of data over the on-chip communication fabric. This dissertation demonstrates the need for examining the effects of frequency, supply voltage, power dissipation, and temperature on SRAM reliability in a mutually interrelated manner. Our observation contradicts the conventional belief that increasing supply voltage always reduces the failure rate in SRAMs. Because of thermal effects, an increase in the supply voltage can also lead to increase in the SRAM failure rate. This thesis also extends the procedure of system level floorplanning to manage the leakage power and reliability of the design. The fundamental contribution of this thesis is that it advances the traditional design flow in the direction of incorporating thermal awareness during various stages of the flow.
机译:工艺规模的缩小和器件几何尺寸的缩小导致芯片具有更高的性能和复杂度。但是,这些进步是以更高的功率密度和更高的工作温度为代价的。无法通过现有的冷却技术控制工作温度是导致频率增加中断和引入多核架构的主要原因。除了可操作性之外,高温还会带来不利的后果,例如:泄漏功率增加,互连寿命缩短,互连和晶体管的速度变慢,需要昂贵的封装和冷却机制以及制造成本和设计工作量增加。传统上,仅在设计流程的合成后阶段检查散热问题。本文试图将“热感知”从物理层面的设计阶段迁移到VLSI设计流程的早期阶段,并利用它来针对各种设计指标,例如功率,性能,可靠性和可操作性。本文通过将泄漏功率估计与热分布估计结合起来,并捕获温度和泄漏功率之间的正相关性,从而提高了泄漏功率估计的过程。它还将通信体系结构的传统角色提升为有源热管理器。所提出的基于通信体系结构的热管理器通过调节片上通信结构上的数据流来延迟所选组件的执行。本文证明了需要以相互关联的方式检验频率,电源电压,功耗和温度对SRAM可靠性的影响。我们的观察结果与传统的观点相反,即增加电源电压总是会降低SRAM的故障率。由于热效应,电源电压的增加也可能导致SRAM故障率的增加。本文还扩展了系统级布局规划的程序,以管理设计的泄漏功率和可靠性。本论文的根本贡献在于,它在流程的各个阶段朝着整合热意识的方向推进了传统的设计流程。

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