OVERVIEW NO. 133 ATOM PROBE MICROANALYSIS AND NANOSCALE MICROSTRUCTURES IN METALLIC MATERIALS

摘要

An atom probe field ion microscope (APFIM) is a unique microanalytical instrument with a single atom detection sensitivity. By employing a three-dimensional atom probe (3DAP), alloying elements can be mapped out in a three-dimensional space with near-atomic resolution. APFIM is particularly useful for the analysis of solute clusters and small precipitate particles, because it can collect atoms exclusively from nanoscale particles embedded in a matrix. These features are suitable for characterizing the compli- cated microstructures in commercial metallic materials. Recent atom probe investigations on the nanoscale microstructures of the metallic materials are overviewed to demonstrate the unique feature of the APFIM technique.