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Conductor Loss of Capacitively Loaded Slow Wave Electrodes for High-Speed Photonic Devices

机译:高速光子器件电容性负载慢波电极的导体损耗

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摘要

In this paper, analytical expressions are presented for the microwave attenuation of slow wave electrodes obtained by periodically loading a regular coplanar line with capacitive elements. Such electrodes are commonly used in III-V compound semiconductor electro-optic modulators and other traveling wave devices. These results are obtained by modifying the existing analytical loss expressions for regular coplanar lines based on physical arguments. The predictions of these expressions are compared with experimental results up to 35 GHz and agreement is found to be very good. Validity of this analysis is also discussed. It is found that the approach works very well for lines of practical interest. Hence, the proposed approach enables complete design of capacitively loaded slow wave electrodes by predicting the microwave loss with closed-form equations in addition to velocity and characteristic impedance.
机译:在本文中,给出了通过周期性地用电容性元件加载规则的共面线而获得的慢波电极的微波衰减的解析表达式。这种电极通常用于III-V族化合物半导体电光调制器和其他行波装置中。这些结果是通过基于物理参数修改规则共面线的现有分析损失表达式而获得的。将这些表达式的预测结果与高达35 GHz的实验结果进行比较,发现一致性非常好。还讨论了这种分析的有效性。发现该方法对于实际感兴趣的行非常有效。因此,除了速度和特性阻抗外,所提出的方法还可以通过使用封闭形式的方程式预测微波损耗,从而实现电容负载慢波电极的完整设计。

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