The new external ion beam analysis setup at the Demokritos Tandem accelerator and first applications in cultural heritage

摘要

At the 5.5 MV Tandem VdG accelerator of the Institute of Nuclear Physics of N.C.S.R. "Demokritos", Athens, Greece, an external ion-beam set-up has been recently developed and installed. The aim of this development was to integrate the analytical capabilities of the PIXE, RBS and PIGE ion beam techniques in one experimental set-up, so that to attain a complete elemental and near surface structural characterization of samples in an almost non-destructive way and without any limitation concerning their size or conductive state. A careful 3D mechanical drawing optimized the set-up experimental parameters achieving probe dimensions at the millimeter range (1 mm2) and fulfilling the special requirements imposed for optimum performance of the aforementioned techniques, including the possibility to use heavier, than protons, ion beams. For the digital pulse processing of the X-ray, y-ray and charged particle detector signals, novel hardware and software tools were developed based on a custom FPGA configuration. The first applications were focused in the quality control of materials that have been intentionally contaminated with a particular tracer-element ("tagged" materials). The tagged materials which were developed and tested are technologically authentic replicas of ancient attic ceramics with black glazed decoration. Analytical diagnostic studies were carried out for a few representative paintings of contemporary Greek painters in order to identify and document materials/pigments and techniques and eventually to prevent trade of fakes. Finally, ancient glass beads were also examined with respect to the sodium concentration and its in-depth homogeneity.