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机译:PL和XPS研究GaN外延层上各种慢速高电荷重离子产生的辐射损伤
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Institute of Modern Physics, Chinese Academy of Sciences, No. 509 Nanchang Road, Lanzhou 730000, China;
Gallium nitride (GaN); Highly charged ions (HCI); Photoluminescence (PL); X-ray photoelectron spectroscopy (XPS);
机译:3-14 XPS研究GaN外延层上各种慢速高电荷重离子产生的辐射损伤
机译:HRXRD,AFM和光学研究GaN外延层中快速重离子辐照产生的损伤
机译:MeV惰性气体离子在GaN外延层中产生的辐射损伤的拉曼散射光谱研究
机译:慢速高电荷离子产生的爆炸C_(60)离子的动能释放
机译:同步辐射和SWIFT离子冲击产生的慢速高电荷离子的回旋能测量
机译:290-MeV 238U32 +离子辐照对Al2O3上的外延GaN层的损害
机译:使用在独立式GaN衬底上生长的外延n-GaN层实现高稳定性和低态密度Al2O3 / GaN界面