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Use of silicon drift detectors for the detection of medium-light elements in PIXE

机译:使用硅漂移检测器检测PIXEL中的中光元素

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摘要

In order to fully exploit in PIXE the superior performance of silicon drift detectors especially for the detection of low- and medium-energy X-rays, avoiding in particular the negative effects of backscattered particles, we developed a custom spectrometer based on a 10 mm2 chip with a thermoelectric Peltier cooler and home-designed front-end electronics, coupled to a weakly focusing polycapillary lens. This paper briefly describes the detector + lens assembly and reports the results of first tests carried out at an external beam line of the LABEC laboratory in Florence. Excellent energy resolution is achieved under real operating conditions in a PIXE run (measured FWHM at 1 keV is 81 eV with a count-rate of 480 cps) and also the lineshapes are very good (FW1/10M over FWHM ratio is 2.1). As a whole, our preliminary tests gave encouraging results and also helped to point out some aspects which it is worthwhile to investigate further (e.g. how X-ray peak intensity ratios may be affected by inaccurate lens alignment), in order to profit fully from such a good performance of the spectrometer.
机译:为了在PIXE中充分利用硅漂移检测器的卓越性能,特别是用于检测中低能X射线,特别是避免了背向散射粒子的负面影响,我们开发了一种基于10 mm2芯片的定制光谱仪配有热电珀尔帖(Peltier)冷却器和家庭设计的前端电子设备,并与弱聚焦的多毛细管透镜耦合。本文简要介绍了探测器和透镜组件,并报告了在佛罗伦萨LABEC实验室的外部光束线上进行的首次测试的结果。在PIXE运行中,在实际工作条件下可实现出色的能量分辨率(在1 keV下测得的FWHM为81 eV,计数率为480 cps),而且线形也非常好(FW1 / 10M超过FWHM比为2.1)。总体而言,我们的初步测试给出了令人鼓舞的结果,还帮助指出了值得进一步研究的某些方面(例如,不正确的透镜对准可能会如何影响X射线峰强度比),以便从这种方法中充分获利。光谱仪性能良好。

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  • 来源
    《Nuclear Instruments & Methods in Physics Research》 |2008年第10期|p.2296-2300|共5页
  • 作者单位

    Dipartimento di Elettronica e Informazione, Politecnico di Milano and INFN ~ Sezione di Milano, Italy;

    IFG- Institute for Scientific Instruments GmbH, Berlin, Germany;

    Dipartimento di Fisica, Universitd degli Studi di Firenze and INFN, Sezione di Firenze, Italy ,Dipartimento di Fisica and INFN, Via G. Sansone 1, 50019 Sesto Fiorentino (Firenze), Italy;

    Dipartimento di Elettronica e Informazione, Politecnico di Milano and INFN ~ Sezione di Milano, Italy;

    Dipartimento di Elettronica e Informazione, Politecnico di Milano and INFN ~ Sezione di Milano, Italy;

    Dipartimento di Elettronica e Informazione, Politecnico di Milano and INFN ~ Sezione di Milano, Italy ,IFN-CNR, Sezione di Milano, Italy;

    Dipartimento di Elettronica e Informazione, Politecnico di Milano and INFN ~ Sezione di Milano, Italy;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    PIXE; silicon drift detector; high-resolution x-ray spectroscopy; x-ray polycapillary;

    机译:PIXE;硅漂移检测器;高分辨率X射线光谱;X射线多毛细血管;

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