Development of secondary ion mass spectroscopy using medium energy C_(60) ion impact

摘要

In this paper, we report time-of-flight (TOF) secondary ion mass spectroscopy using primary C_(60) ions with an energy range from several tens of keV to several hundreds of keV. Application of the spectroscopy to the analysis of a poly(amino acid) film revealed that characteristic peaks, necessary for identification of the amino acid in proteins, show higher intensities for medium energy C_(60) (120 keV _C(60)~+ and 540 keV C_(60)~(2+)) impacts than those for low energy C_(60) (30 keV C_(60)~+) impacts. This finding demonstrates that medium energy C_(60) ion impacts are useful for highly sensitive characterization of amino acids.