LOOKING THROUGH THE articles in this special issue on embedded memories, I see several answers to the eternal problem of trading off memory capacity, speed, and power. Unsurprisingly, the articles are all inwardly focused, each describing attempts to find the best new memory technology. Test people, however, see memories from a very different perspective. Design has been moving to the RTL and higher levels for many years. Those of us working in the area of logic test are still stuck at the gate level; we are the assembly language programmers of the design world. Memories are different--even for us, they are inherently functional.
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