An ultra high speed test system

摘要

The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.