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PROFILING THE RESIDUAL STRESS IN 6061Al-15vol. SiC{sub}w COMPOSITE

机译:分析6061Al-15%Vol中的残余应力。 sic {sub} W复合材料

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The residual stress, RS, profiles in a 6061Al-15vol%SiC{sub}w composite and its alloy matrix were determined by synchrotron radiation diffraction, SRD, at the ESRF, Grenoble, France. SRD could resolve the spatial dependence of all three principal components of the RS field. The origin of the macro stress could unambiguously be identified as the parabolic temperature gradient present during quenching and a confirmation of many theoretical works could be given.
机译:通过同步辐射衍射,SRD,在ESRF,Grenoble,法国的同步辐射衍射,SRD测定,在6061A1-15Vol%SiC {Sub {Sub} W复合材料中的残留应力Rs和其合金基质。 SRD可以解决RS字段所有三个主要组成部分的空间依赖性。宏应力的起源可以明确地被识别为在淬火期间存在的抛物线温度梯度,并且可以给出许多理论作品的确认。

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